论文标题
纳米颗粒位置和质量的基于强大的基于光电的计量学
Robust optical-levitation-based metrology of nanoparticle's position and mass
论文作者
论文摘要
通过隔离环境噪声，基于高真空中的光学相互作用，光在精确测量中表现出令人难以置信的能力。但是，仍然存在障碍物，例如位移和质量估计误差，极大地阻碍了纳米级绝对准确性的提高。在这里，我们提出了一种基于非线性的计量学，以精确测量纳米颗粒的位置和质量，其光悬浮在$ 10^{ - 5} $ MBAR下，比静电量和基于随机力的基于静电级别的同行低6级。通过精确控制非线性方向上悬浮的纳米颗粒的振幅，我们意识到了可行的子点级级别的位置测量值，不确定$ 1.0 \％$ $ $ $ $ $，而无需先前的质量信息，可以进一步适用于具有2.2 $ $ $ $ $ $ $ $ $ $ $ $ $ 2.2 $ 2.2的质量图级质量。它还将为在高真空中构建良好的光学机电平台的方式铺平道路，以在纳米级的力和加速度上进行高灵敏度和准确性测量以及在中镜量表上进行量子叠加的研究。
Light has shown up an incredibe capability in precision measurement based on opto-mechanic interaction in high vacuum by isolating environment noises. However, there are still obstructions, such as displacement and mass estimation error, highly hampering the improvement of absolute accuracy at the nanoscale. Here, we present a nonlinearity based metrology to precisely measure the position and mass of a nanoparticle with optical levitation under $10^{-5}$ mbar, 6-order of magnitude lower than the electrostatic-force and stochastic-force-based counterparts. By precisely controlling the amplitude of the levitated nanoparticle at the nonlinear regime, we realized a feasible sub-picometer-level position measurement with an uncertainty of $1.0\%$ without the prior information of mass, which can be further applied to weigh the femtogram-level mass with an uncertainty of $2.2\%$. It will also pave the way to construct a well-calibrated opto-mechanic platform in high vacuum for high sensitivity and accuracy measurement in force and acceleration at the nanoscale and the study in quantum superposition at the mesoscopic scale.
