论文标题
在低维系统中使用电子镜头的电子聚焦的演示
Demonstration of electron focusing using electronic lenses in low-dimensional system
论文作者
论文摘要
我们报告了N型GAA中的全电动集成电子聚焦镜头。结果表明，当焦点与片上检测器对齐时，发生一个明显的聚焦峰。聚焦峰的强度和全宽度最大（FWHM）与注射电子的准直相关。为了证明报告的聚焦镜头可以是一个有用的工具，我们在借助聚焦透镜的帮助下研究了不对称门偏置量子点接触的特征。观察到低电导状态中电导异常的发生与聚焦峰的FWHM增加之间的相关性。相关可能是由于电子电子相互作用引起的。报告的电子聚焦镜头对于更先进的电子光学设备至关重要。
We report an all-electric integrable electron focusing lens in n-type GaAs. It is shown that a pronounced focusing peak takes place when the focal point aligns with an on-chip detector. The intensity and full width half maximum (FWHM) of the focusing peak are associated with the collimation of injected electrons. To demonstrate the reported focusing lens can be a useful tool, we investigate characteristic of an asymmetrically gate biased quantum point contact with the assistance of focusing lens. A correlation between the occurrence of conductance anomaly in low conductance regime and increase in FWHM of focusing peak is observed. The correlation is likely due to the electron-electron interaction. The reported electron focusing lens is essential for a more advanced electron optics device.
