论文标题
通过量子控制的测量结果在直接状态测量中的系统错误
Systematic errors in direct state measurements with quantum controlled measurements
论文作者
论文摘要
冯·诺伊曼（Von Neumann）测量框架描述了目标系统和探针之间的动态相互作用。相比之下，量子控制的测量框架使用量子探针来控制目标系统上不同操作员的作用，并方便建立通用量子计算。在这项工作中，我们使用量子控制的测量框架直接测量量子状态。我们介绍了两种类型的量子控制测量框架，并研究由这些类型引起的系统误差（真实值和估计值之间的偏差）。我们通过数值研究系统误差，评估置信区域，并研究由不完善的检测引起的实验噪声的影响。我们的分析在直接量子层析成像中具有重要的应用。
Von Neumann measurement framework describes a dynamic interaction between a target system and a probe. In contrast, a quantum controlled measurement framework uses a qubit probe to control the actions of different operators on the target system, and convenient for establishing universal quantum computation. In this work, we use a quantum controlled measurement framework for measuring quantum states directly. We introduce two types of the quantum controlled measurement framework and investigate the systematic error (the bias between the true value and the estimated values) that caused by these types. We numerically investigate the systematic errors, evaluate the confidence region, and investigate the effect of experimental noise that arises from the imperfect detection. Our analysis has important applications in direct quantum state tomography.
