论文标题
使用X射线反射光谱和具有有限厚度的薄磁盘模型测试Kerr黑洞假设
Testing the Kerr black hole hypothesis using X-ray reflection spectroscopy and a thin disk model with finite thickness
论文作者
论文摘要
X射线反射光谱是用于探测黑洞强的重力区域的强大工具，可用于测试强场状态中的一般相对性。可用相对论反射模型的简化限制了对黑洞性能进行准确测量的能力。在本文中，我们提出了模型relxill_nk的扩展，其中积聚磁盘具有有限的厚度，而不是无限薄的。我们采用了Taylor＆Reynolds（2018）提出的积聚磁盘几何形状，并为黑洞的质量增生率的不同值构建了相对论反射模型。我们将新模型应用于X射线二进制GRS 1915+105的高质量Suzaku数据，以探索磁盘厚度对KERR指标测试的影响。
X-ray reflection spectroscopy is a powerful tool for probing the strong gravity region of black holes and can be used for testing general relativity in the strong field regime. Simplifications of the available relativistic reflection models limit the capability of performing accurate measurements of the properties of black holes. In this paper, we present an extension of the model RELXILL_NK in which the accretion disk has a finite thickness rather than being infinitesimally thin. We employ the accretion disk geometry proposed by Taylor & Reynolds (2018) and we construct relativistic reflection models for different values of the mass accretion rate of the black hole. We apply the new model to high quality Suzaku data of the X-ray binary GRS 1915+105 to explore the impact of the thickness of the disk on tests of the Kerr metric.
