论文标题
固态故障电流限制器的组件水平冗余拓扑的可靠性分析
Reliability Analysis of Component Level Redundant Topologies for solid state Fault Current Limiter
论文作者
论文摘要
经验表明，电力电子系统中的半导体开关是最脆弱的组件。解决这一可靠性挑战的最常见方法之一是组件级冗余设计。组件级中的冗余设计有四种可能的配置。本文介绍了固态故障电流限制器（SSFCL）的不同组件级冗余设计之间的比较可靠性分析。建议的分析的目的是确定更可靠的组件级冗余配置。平均失败时间（MTTF）用作可靠性参数。考虑到两种故障类型（开路和短路），计算了不同配置的MTTF。证明更可靠的配置取决于稳态下半导体开关的连接温度。连接温度是i）环境温度的函数，ii）半导体开关的功率损失和iii）散热器的热电阻。同样，研究结果对每个参数的敏感性也会研究。结果表明，在不同条件下，各种配置具有更高的可靠性。提出了实验结果，以阐明所提出方法的理论和可行性。最后，分析了不同配置的级别成本以进行公平比较。
Experience shows that semiconductor switches in power electronics systems are the most vulnerable components. One of the most common ways to solve this reliability challenge is component-level redundant design. There are four possible configurations for the redundant design in component-level. This paper presents a comparative reliability analysis between different component-level redundant designs for solid state fault current limiter (SSFCL). The aim of the proposed analysis is to determine the more reliable component-level redundant configuration. The mean time to failure (MTTF) is used as the reliability parameter. Considering both fault types (open circuit and short circuit), the MTTFs of different configurations are calculated. It is demonstrated that more reliable configuration depends on the junction temperature of the semiconductor switches in the steady state. That junction temperature is a function of i) ambient temperature, ii) power loss of the semiconductor switch and iii) thermal resistance of heat sink. Also, results sensitivity to each parameter is investigated. The results show that in different conditions, various configurations have higher reliability. The experimental results are presented to clarify the theory and feasibility of the proposed approaches. At last, levelized costs of different configurations are analyzed for a fair comparison.
