论文标题
在单通量量子（SFQ）同步器中的亚竞服的建模和表征
Modeling and Characterization of Metastability in Single Flux Quantum (SFQ) Synchronizers
论文作者
论文摘要
尽管有低功率和高频单量量子（SFQ）技术的承诺，但扩展这些电路仍然是一个严重的挑战，它激发了多个SFQ时钟域的支持。为此，本文分析了设置时间违规的影响和在SFQ电路中比较派生的分析模型与CMOS对应物的影响。然后，它扩展了该模型，以估算基于Flip-Flop的同步器的失败（MTBF）之间的平均时间，并将曲线拟合到该模型与最新的SFQ5EE过程中的模拟。有趣的是，我们发现两个FLOP SFQ同步器的MTBF估计为10^6年。
Despite the promises of low-power and high-frequency of single-flux quantum (SFQ) technology, scaling these circuits remains a serious challenge that motivates the support of multiple SFQ clock domains. Towards this end, this paper analyzes the impact of setup time violations and metastability in SFQ circuits comparing the derived analytical models to their CMOS counterparts. It then extends this model to estimate the Mean Time Between Failure (MTBF) of flip-flop-based synchronizers and curve fits this model to simulations in the state-of-the-art SFQ5ee process. Interestingly, we find a two-flop SFQ synchronizer has an estimated MTBF of 10^6 years.
