论文标题
使用瞬态波动定理在原子力显微镜中校准力测量
Calibrated force measurement in Atomic Force Microscopy using the Transient Fluctuation Theorem
论文作者
论文摘要
瞬态波动定理用于通过测量通过在collo { ^} dal探针和表面之间使用的时间依赖力进行的工作的波动来校准原子力显微镜。从这个措施中，一个人可以轻松提取相互作用力的值和悬臂的相关参数。将该分析的结果与通过标准校准方法获得的结果进行了比较。 a）当前的地址：ISIS，UNIV。
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{ï}dal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods. a) present adress: ISIS, Univ.
