论文标题
使用超导微波谐振器的材料损失测量
Materials loss measurements using superconducting microwave resonators
论文作者
论文摘要
用于量子计算的超导电路的性能受到材料损失的限制。特别是,相干时间通常在单光子功率和millikelvin温度下由两级系统(TLS)损失界定。低损失制造技术,材料和薄膜介电的鉴定对于实现可扩展的架构以实现超导量子计算至关重要。超导微波谐振器为评估性能和研究TLS丢失和其他与超导电路有关的机制提供了方便的Qubit代理,例如非平衡的准膜片和磁通量涡流。在这篇评论文章中,我们提供了设计准确的谐振器实验以表征损失的考虑因素,包括适用的损失类型,低温设置,设备设计以及提取材料和界面损失的方法,总结了已经发展了二十多年的技术。还总结了各种材料和过程的测量结果。最后,我们提出了向微波谐振器报告损失数据的建议,以促进整个现场的材料比较。
The performance of superconducting circuits for quantum computing is limited by materials losses. In particular, coherence times are typically bounded by two-level system (TLS) losses at single photon powers and millikelvin temperatures. The identification of low loss fabrication techniques, materials, and thin film dielectrics is critical to achieving scalable architectures for superconducting quantum computing. Superconducting microwave resonators provide a convenient qubit proxy for assessing performance and studying TLS loss and other mechanisms relevant to superconducting circuits such as non-equilibrium quasiparticles and magnetic flux vortices. In this review article, we provide an overview of considerations for designing accurate resonator experiments to characterize loss, including applicable types of loss, cryogenic setup, device design, and methods for extracting material and interface losses, summarizing techniques that have been evolving for over two decades. Results from measurements of a wide variety of materials and processes are also summarized. Lastly, we present recommendations for the reporting of loss data from superconducting microwave resonators to facilitate materials comparisons across the field.