论文标题

反复的辐射损伤和雪崩光电二极管的热退火

Repeated radiation damage and thermal annealing of avalanche photodiodes

论文作者

DSouza, Ian, Bourgoin, Jean-Philippe, Higgins, Brendon L., Lim, Jin Gyu, Tannous, Ramy, Agne, Sascha, Moffat, Brian, Makarov, Vadim, Jennewein, Thomas

论文摘要

雪崩光电二极管(APD)非常适合量子通信卫星上的单光子检测,因为它们是一种具有高检测效率的成熟技术,而无需低温冷却。但是,它们容易大大增加因轨内辐射损伤引起的热噪声。先前的工作表明,一次性热退火的一次性应用减少了辐射损伤引起的APD热噪声。在这里,我们研究了周期性质子辐射和热退火的影响。我们使用一个加速的测试环境,该环境模拟了低地球轨道中卫星的现实两年操作概况。我们表明,重复的热退火可有效地维持适合在整个名义任务寿命及以后的量子键分布的范围内保持硅APD的热噪声。我们检查了两种策略 - 在固定的时间内退火,并且仅当热噪声超过预定义的极限时才退火。我们发现两种策略在寿命末都表现出相似的热噪声,有条件地退火的总体优势略有优势。我们还观察到,检测器的螺栓效率随累积质子照射而增加。这些知识有助于指导未来太空量子量子通信应用的设计和任务决策。

Avalanche photodiodes (APDs) are well-suited for single-photon detection on quantum communication satellites as they are a mature technology with high detection efficiency without requiring cryogenic cooling. They are, however, prone to significantly increased thermal noise caused by in-orbit radiation damage. Previous work demonstrated that a one-time application of thermal annealing reduces radiation-damage-induced APD thermal noise. Here we examine the effect of cyclical proton irradiation and thermal annealing. We use an accelerated testing environment which emulates a realistic two-year operating profile of a satellite in low-Earth-orbit. We show that repeated thermal annealing is effective at maintaining thermal noise of silicon APDs within a range suitable for quantum key distribution throughout the nominal mission life, and beyond. We examine two strategies -- annealing at a fixed period of time, and annealing only when the thermal noise exceeds a pre-defined limit. We find both strategies exhibit similar thermal noise at end-of-life, with a slight overall advantage to annealing conditionally. We also observe that afterpulsing probability of the detector increases with cumulative proton irradiation. This knowledge helps guide design and tasking decisions for future space-borne quantum communication applications.

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