论文标题

高度均匀过渡金属二分法生长元素的垂直CVD生长

Vertical CVD Growth of Highly Uniform Transition Metal Dichalcogenides

论文作者

Tang, Lei, Li, Tao, Luo, Yuting, Feng, Simin, Cai, Zhengyang, Zhang, Hang, Liu, Bilu, Cheng, Hui-Ming

论文摘要

二维(2D)过渡金属二分元素(TMDC)由于其物理和化学特性而引起了极大的关注,这使它们在电子和光电子中有希望。由于难以控制固体前体的浓度和空间不均匀的生长动力学,因此到目前为止,以均匀性和可重复性的良好性和可重复性来种植晶圆尺度的2D TMDC是一项挑战,这极大地阻碍了其实际使用。在这里,我们报告了一种垂直化学蒸气沉积(VCVD)设计,以在整个晶圆上生长具有均匀密度和高质量的单层TMDC,并且具有出色的可重复性。这种VCVD设计的使用可以轻松控制前体浓度,气流和温度的三个关键生长参数,这在当前使用广泛使用的水平CVD系统中无法完成。统计结果表明,包括MOS2和WS2在内的VCVD生长的单层TMDC对基板的尺寸高于均匀和质量。我们还通过VCVD生长的TMDC样品的一步转移制造了多个范德华异质结构,并具有其良好的均匀性。这项工作为在晶圆尺度上具有高均匀性和可重复性的2D材料开辟了一种方法,该材料可用于可扩展的2D材料及其异质结构。

Two-dimensional (2D) transition metal dichalcogenides (TMDCs) have attracted great attention due to their physical and chemical properties that make them promising in electronics and optoelectronics. Because of the difficulties in controlling concentrations of solid precursors and spatially non-uniform growth dynamics, it is challenging to grow wafer-scale 2D TMDCs with good uniformity and reproducibility so far, which significantly hinders their practical use. Here we report a vertical chemical vapor deposition (VCVD) design to grow monolayer TMDCs with a uniform density and high quality over the whole wafer, and with excellent reproducibility. The use of such VCVD design can easily control the three key growth parameters of precursor concentration, gas flow and temperature, which cannot be done in currently widely-used horizontal CVD system. Statistical results show that VCVD-grown monolayer TMDCs including MoS2 and WS2 are of high uniformity and quality on substrates over centimeter size. We also fabricated multiple van der Waals heterostructures by the one-step transfer of VCVD-grown TMDC samples, owning to its good uniformity. This work opens a way to grow 2D materials with high uniformity and reproducibility on the wafer scale, which can be used for the scalable fabrication of 2D materials and their heterostructures.

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