论文标题
分析钙钛矿材料的TEM表征的错误识别
Analysis of misidentifications in TEM characterization of perovskite material
论文作者
论文摘要
由于其出色的特性，有机无机杂种钙钛矿（OIHP）最近已成为开创性的半导体材料。作为非常强大的特征工具，透射电子显微镜（TEM）已被广泛用于钙钛矿材料中，用于结构分析和相位识别。但是，钙钛矿对电子束高度敏感，并且很容易分解为PBX2（X = i，br，cl）和金属PB。一般高分辨率TEM的电子剂量远高于MAPBI3的临界剂量，这导致普遍的错误认识，即PBI2和Pb错误地标记为钙钛矿。广泛存在的错误对钙钛矿研究领域的发展产生了负面影响。在这里总结和纠正了最著名的Mapbi3钙钛矿的误解，然后将错误的原因分类和确定。最重要的是，还提出了一种可减少钙钛矿材料辐射损伤的实用策略的可靠方法。这篇综述旨在提供错误的原因，并避免将来在钙钛矿研究领域误解。
Organic-inorganic hybrid perovskites (OIHPs) have recently emerged as groundbreaking semiconductor materials owing to their remarkable properties. Transmission electron microscopy (TEM), as a very powerful characterization tool, has been widely used in perovskite materials for structural analysis and phase identification. However, the perovskites are highly sensitive to electron beams and easily decompose into PbX2 (X= I, Br, Cl) and metallic Pb. The electron dose of general high-resolution TEM is much higher than the critical dose of MAPbI3, which results in universal misidentifications that PbI2 and Pb are incorrectly labeled as perovskite. The widely existed mistakes have negatively affected the development of perovskite research fields. Here misidentifications of the best-known MAPbI3 perovskite are summarized and corrected, then the causes of mistakes are classified and ascertained. Above all, a solid method for phase identification and practical strategies to reduce the radiation damage for perovskite materials have also been proposed. This review aims to provide the causes of mistakes and avoid misinterpretations in perovskite research fields in the future.
