论文标题

边缘模式工程,用于最佳的超级氮化硅膜

Edge mode engineering for optimal ultracoherent silicon nitride membranes

论文作者

Ivanov, E., Capelle, T., Rosticher, M., Palomo, J., Briant, T., Cohadon, P. -F., Heidmann, A., Jacqmin, T., Deléglise, S.

论文摘要

由于它们的高力敏感性,在像谐振力成像,质量传感或空腔光学力学的田间中,高度要求将低机械耗散与较小的运动质量相结合的机械谐振器。 “软联系”是一种语音工程技术,通过该技术,高应激的膜或字符串的机械模式远离有损区域,从而为NG尺度设备提供了Ultrahigh-Q。在这里,我们报告了由结构的有限大小引起的寄生模式,这些模式可能会大大降低这些膜的性能。通过干涉测量和有限元模拟,我们表明这些寄生模式可以与结构的局部模式杂交,从而将质量因子最多减少一个数量级。为了解决这个问题,我们设计了寄生模式的光谱曲线,以避免它们与高Q缺陷模式重叠。我们通过统计分析验证,这种模态工程可重复地在制造的设备中产生更高质量的因素,这与理论上预测的值一致。

Due to their high force sensitivity, mechanical resonators combining low mechanical dissipation with a small motional mass are highly demanded in fields as diverse as resonant force imaging, mass sensing, or cavity optomechanics. "Soft-clamping" is a phononic engineering technique by which mechanical modes of highly-stressed membranes or strings are localized away from lossy regions, thereby enabling ultrahigh-Q for ng-scale devices. Here, we report on parasitic modes arising from the finite size of the structure which can significantly degrade the performance of these membranes. Through interferometric measurements and finite-element simulations, we show that these parasitic modes can hybridize with the localized modes of our structures, reducing the quality factors by up to one order of magnitude. To circumvent this problem, we engineer the spectral profile of the parasitic modes in order to avoid their overlap with the high-Q defect mode. We verify via a statistical analysis that this modal engineering reproducibly yields higher quality factors in fabricated devices, consistent with theoretically predicted values.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源