论文标题
XRMR和XMCD检测到的PT中磁接近效应的定量比较
Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD
论文作者
论文摘要
X射线谐振磁反射率（XRMR）允许同时测量各种薄膜样品的结构，光学和磁磁特性以及深度曲线。但是，使用XRMR和X射线磁性圆形二色性（XMCD）观察到的磁性特性的同一样本同一样本系统定量比较仍在待处理。在此，与经过定量分析的XMCD结果相比，与沉积在两种不同的铁磁材料Fe和Co $ _ {33} $ _ {33} $ _ {33} $ _ {33} $ _ {33} $ _ {33} $ _ {33} $ _ {33} $ _ {33} $ _ {67} $的PT中的XRMR结果（pt l $ _ {3} $吸收边缘）与经过定量分析的XMCD结果相比。获得的结果在基于吸收的基于吸收（XMCD）和基于反射率（XRMR）技术之间具有非常良好的定量一致性。因此，结果表明，XRMR在这种类型的磁接口处提供了对旋转量子和旋转热量传输现象重要的定量可靠自旋深度曲线。
X-ray resonant magnetic reflectivity (XRMR) allows for the simultaneous measurement of structural, optical and magnetooptic properties and depth profiles of a variety of thin film samples. However, a same-beamtime same-sample systematic quantitative comparison of the magnetic properties observed with XRMR and x-ray magnetic circular dichroism (XMCD) is still pending. Here, the XRMR results (Pt L$_{3}$ absorption edge) for the magnetic proximity effect in Pt deposited on the two different ferromagnetic materials Fe and Co$_{33}$Fe$_{67}$ are compared with quantitatively analyzed XMCD results. The obtained results are in very good quantitative agreement between the absorption-based (XMCD) and reflectivity-based (XRMR) techniques taking into account an ab initio calculated magnetooptic conversion factor for the XRMR analysis. Thus, it is shown that XRMR provides quantitative reliable spin depth profiles important for spintronic and spin caloritronic transport phenomena at this type of magnetic interfaces.
