论文标题
Terahertz集成系统的(001)GAAS底物上的Bi2SE3增长
Bi2Se3 Growth on (001) GaAs Substrates for Terahertz Integrated Systems
论文作者
论文摘要
Terahertz(THZ)技术多年来一直引起人们的关注,这是因为应用程序的多种多样,包括气体传感,生物系统的非离子成像,安全和防御等。迄今为止,科学家已经使用了不同类别的材料来执行不同的THZ功能。但是,要组装一个芯片THZ集成系统,我们必须了解如何整合这些不同的材料。在这里,我们探索了BI2SE3的生长,Bi2Se3是一种拓扑绝缘子(TI)材料,可以用作技术重要的GAA(001)底物的THZ集成设备中的等离子波导。我们探索表面处理,发现尽管膜/底物相互作用相对较弱,但原子上光滑的GAAS表面对于获得高质量的BI2SE3膜至关重要。计算表明,BI2SE3/GAAS界面可能是硒末端的,并且没有显示BI2SE3和底物之间化学键合的证据。这些结果是将范德华材料与常规半导体底物相结合的指南,并作为实现片上THZ集成系统的第一步。
Terahertz (THz) technologies have been of interest for many years due to the variety of applications including gas sensing, nonionizing imaging of biological systems, security and defense, etc. To date, scientists have used different classes of materials to perform different THz functions. However, to assemble an on-chip THz integrated system, we must understand how to integrate these different materials. Here, we explore the growth of Bi2Se3, a topological insulator (TI) material that could serve as a plasmonic waveguide in THz integrated devices, on technologically-important GaAs (001) substrates. We explore surface treatments and find that atomically smooth GaAs surface is critical to achieving high-quality Bi2Se3 films despite the relatively weak film/substrate interaction. Calculations indicate that the Bi2Se3/GaAs interface is likely selenium-terminated and shows no evidence of chemical bonding between the Bi2Se3 and the substrate. These results are a guide for integrating van der Waals materials with conventional semiconductor substrates and serve as the first steps toward achieving an on-chip THz integrated system.