论文标题
last $ _2 $ si $ _2 $的谐振软X射线散射
Resonant Soft X-Ray Scattering on LaPt$_2$Si$_2$
论文作者
论文摘要
X射线吸收（XAS）和共振非弹性X射线散射（RIX）光谱$ _2 $ _2 $ si $ _2 $单晶在Si L和La n边缘中显示。数据是用密度功能理论来解释的，表明可以用Si $ s $和$ d $局部局部密度（LPDOS）来描述SI光谱，而LA Spectra是由于准原子$ 4F $ 4F $刺激。计算表明，PT $ D $ -LPDO在被占领的国家中占主导地位，并且在空置状态下发现了一个尖锐的局部la $ f $州，这与观察结果一致。
X-ray absorption (XAS) and Resonant Inelastic X-ray Scattering (RIXS) spectra of LaPt$_2$Si$_2$ single crystal at the Si L and La N edges are presented. The data are interpreted in terms of density functional theory, showing that the Si spectra can be described in terms of Si $s$ and $d$ local partial density of states (LPDOS), and the La spectra are due to quasi-atomic local $4f$ excitations. Calculations show that Pt $d$-LPDOS dominates the occupied states, and a sharp localized La $f$ state is found in the unoccupied states, in line with the observations.
