论文标题
测量微型和纳米结构空间分布的随机性：扫描电子显微镜图像处理和分析的影响
Measuring the randomness of micro and nanostructure spatial distributions: Effects of Scanning Electron Microscope image processing and analysis
论文作者
论文摘要
表面微观和纳米结构的随机性程度和聚集程度的定量表征对于评估其对靶向功能的影响至关重要。为此，在生态学和医学成像中主要使用的点模式分析方法（PPA）似乎提供了强大的工具集。但是，这些技术的应用需要从其显微镜图像中提取纳米结构的点模式。在这项工作中，我们解决了扫描电子显微镜（SEM）图像处理可能对PPA的基本指标（即最近的邻居指数（NNI））产生的影响的问题。以示例为例，我们从次级和反向散射电子中获取的聚合物微型和纳米结构的两个典型SEM图像，我们报告了a）噪声滤波和b）二元化阈值对NNI值的影响以及图像有限尺寸效应的影响。基于这些结果，我们为安全选择SEM设置的安全得出结论，以通过NNI估计准确地测量纳米结构随机性。
The quantitative characterization of the degree of randomness and aggregation of surface micro and nanostructures is critical to evaluate their effects on targeted functionalities. To this end, the methods of Point Pattern Analysis (PPA), largely used in ecology and medical imaging, seem to provide a powerful toolset. However, the application of these techniques requires the extraction of the point pattern of nanostructures from their microscope images. In this work, we address the issue of the impact that Scanning Electron Microscope (SEM) image processing may have on the fundamental metric of PPA, i.e. the Nearest Neighbour Index (NNI). Using as examples two typical SEM images of polymer micro- and nanostructures taken from secondary and backscattered electrons, we report the effects of the a) noise filtering and b) binarization threshold on the value of NNI as well as the impact of the image finite size effects. Based on these results, we draw conclusions for the safe choice of SEM settings to provide accurate measurement of nanostructure randomness through NNI estimation.
