论文标题
$ W $ -BOSON质量，Electroweak Precision测试和SMEFT
$W$-Boson Mass, Electroweak Precision Tests and SMEFT
论文作者
论文摘要
最近，Tevatron的CDF合作报告报告了基于Electroweak Precision测试（EWPTS）的$ W $ -BOSON质量的直接测量与其标准模型（SM）预测之间的显着差异。在本文中，我们探讨了这种差异与SM之外的物理学的潜在起源。明确地，我们在与EWPTS相关的SM有效领域理论（SMEFT）的一组六维操作员工作。通过拟合数据，我们证明了$ M_W $的向上变化是由操作员$ \ Mathcal {o} _ {t} = \ frac {1} {1} {2} {2} {2}（h^{\ dagger} \ dagr} \ textset { $ c_t（{\ rm tev}/λ）^2 \ gtrsim 0.01 $。这表明，CDF数据偏爱的新物理量表应为树级效应和子TEV的多个TEV，以进行环路级别的效果。一个简单的示例是引入一个无费用的电子电动三重标量表，该标量可以在树级上提高$ C_T $值。我们还研究了通过测量higgs耦合，$ m_w $和其他ewpts在未来的通函$ e^-e^-e^+calliders上进一步测试相关SMEFT的潜力。
Recently the CDF collaboration at the Tevatron reported a significant discrepancy between the direct measurement of the $W$-boson mass and its Standard Model (SM) prediction based on electroweak precision tests (EWPTs). In this paper we explore the potential origin of this discrepancy from physics beyond the SM. Explicitly, we work on a set of six-dimensional operators in the SM effective field theory (SMEFT) which are relevant to the EWPTs. By fitting to the data, we demonstrate that an upward shift in $m_W$ is driven by the operator $\mathcal{O}_{T}=\frac{1}{2}(H^{\dagger}\overset{\text{$\leftrightarrow$}}{D}_μH)^2$ with a coefficient $c_T ({\rm TeV}/Λ)^2 \gtrsim 0.01$. This suggests that the new physics scale favored by the CDF data should be multiple TeV for tree-level effects and sub TeV for loop-level effects. One simple example is to introduce a hypercharge-free electroweak triplet scalar which can raise the $c_T$ value at tree level. We also study the potential to further test the relevant SMEFT by measuring Higgs-coupling, $m_W$ and other EWPTs at future circular $e^-e^+$ colliders.
