论文标题
单层半导体中的电子传输
Electron transport in the single-layer semiconductor
论文作者
论文摘要
二维(2D)材料是一类新的材料,具有有趣的物理特性和应用,从纳米电子到感应和光子学。除石墨烯外,研究最多的2D材料,其他分层材料(例如半导体的二核苷)MOS2或WSE2的单层作为有前途的晶体晶体管(FET)和光晶体管的有前途的通道材料而变得非常重要。但是,尚不清楚电子传输的特定过程如何受温度影响。因此,如今无法从根本上理解单层半导体的电子动力学。在这里,我们开发了一种分析理论,该理论与传统能量带理论区分开,并得到了蒙特卡洛模拟的支持,该理论预测了电子传输过程以及温度对单层半导体中电子传输的影响。在本文中,建立了一种新型号,以处理Sing层半导体中的电子传输。电阻由屏障而不是单层半导体中的电子散射决定,这是宏观量子效应。在不同的温度下研究了具有不同介电构型的FET中的电子传输,并引入了由顶门电压或底部门面电压决定的新控制因子,以描述栅极电压对2D半导体中电子传输的影响。模拟的结果表明,排水电流主要取决于某些元素,例如温度,顶门电压,底闸压电压和源液压电压。
Two-dimensional (2D) materials are a new class of materials with interesting physical properties and applications ranging from nanoelectronics to sensing and photonics. In addition to graphene, the most studied 2D material, monolayers of other layered materials such as semiconducting dichalcogenides MoS2 or WSe2 are gaining in importance as promising channel materials for field-effect transistors (FETs) and phototransistors. However, it is unclear that how the specific process of electron transport is affected by temperature. So, nowadays the electron dynamics of single-layer semiconductor cannot be understood fundamentally. Here, we develop an analytical theory distinguishing from traditional energy band theory, backed up by Monte-Carlo simulations, that predicts the process of electron transport and the effect of temperature on the electron transport in the single-layer semiconductor. In this paper, A new model is built to deal with electron transporting in the sing-layer semiconductor. The resistance is decided by the barrier rather than the electron scattering in the single-layer semiconductor, which is macroscopic quantum effect. Electron transport in FETs with different dielectric configurations are investigated at different temperatures and a new control factor that is decided by top-gate voltage or bottom-gate voltage is introduced to describe the effect of gate voltage on the electron transport in 2D semiconductor. The results of simulation show the drain current is mainly determined by some elements, such as temperature, top-gate voltage, bottom-gate voltage and source-drain voltage.