论文标题

从头开始预测激发状态和极化效应在瞬态XUV测量$α$ -FE $ -FE $ _2 $ o $ $ _3 $中的效果

Ab Initio Prediction of Excited State and Polaron Effects in Transient XUV Measurements of $α$-Fe$_2$O$_3$

论文作者

Klein, Isabel M., Liu, Hanzhe, Nimlos, Danika, Krotz, Alex, Cushing, Scott K.

论文摘要

由于对载体职业的敏感性以及局部化学或结构变化,瞬态X射线和极端紫外线(XUV)光谱已成为研究光激发动力学的宝贵工具。使用瞬态XUV光谱的研究最多的伴侣 - 河流之一是$α$ -fe $ _2 $ o $ _3 $,因为它具有丰富的光激发动力学,包括小极地形成。目前,使用半经验方法来完成$α$ -FE $ _2 $ o $ _3 $中载体和极化效果的解释,该方法无法转移到大多数材料上。在这里,开发了一种从头算,伯特 - 盐方程(BSE)方法,可以结合对任意材料系统的光激发状态效应。通过计算$α$ -FE $ _2 $ o $ $ _3 $的地面,光激发和极化状态的XUV吸收光谱,证明了这种方法的准确性。此外,理论方法允许投影X射线过渡汉密尔顿的核心价激素和不同的组成部分到频带结构上,从而为旧测量提供了新的见解。从这些信息中,可以构建有关瞬态XUV光谱的起源和性质的物理直觉。对于高度角动量拆分XUV峰,甚至可以证明提取电子和孔能的途径。该方法很容易被推广到K,L,M和N边缘,以提供分析瞬态X射线吸收或反射数据的一般方法。

Transient X-ray and extreme ultraviolet (XUV) spectroscopies have become invaluable tools for studying photoexcited dynamics due to their sensitivity to carrier occupations and local chemical or structural changes. One of the most studied mate-rials using transient XUV spectroscopy is $α$-Fe$_2$O$_3$ because of its rich photoexcited dynamics, including small polaron formation. The interpretation of carrier and polaron effects in $α$-Fe$_2$O$_3$ is currently done using a semi-empirical method that is not transferrable to most materials. Here, an ab initio, Bethe-Salpeter equation (BSE) approach is developed that can incorporate photoexcited state effects for arbitrary materials systems. The accuracy of this approach is proven by calculating the XUV absorption spectra for the ground, photoexcited, and polaron states of $α$-Fe$_2$O$_3$. Furthermore, the theoretical approach allows for the projection of the core-valence excitons and different components of the X-ray transition Hamiltonian onto the band structure, providing new insights into old measurements. From this information, a physical intuition about the origins and nature of the transient XUV spectra can be built. A route to extracting electron and hole energies is even shown possible for highly angular momentum split XUV peaks. This method is easily generalized to K, L, M, and N edges to provide a general approach for analyzing transient X-ray absorption or reflection data.

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