论文标题
具有时空轨道角动量的超快脉冲的单帧表征
Single-frame characterization of ultrafast pulses with spatiotemporal orbital angular momentum
论文作者
论文摘要
带有时空轨道角动量(ST-OAM)的光携带时空轨道动量,使新型的光涡流是由横向OAM引起的。在传播,传播,折射,衍射和非线性转化过程中,St-OAM脉冲在传播,传播,折射,衍射和非线性转化过程中表现出新的特性,从而吸引了不断增长的实验和理论兴趣和研究。但是,一个主要的挑战是缺乏表征超快的ST-OAM脉冲的简单直接方法。使用空间分辨的光谱干涉法,我们演示了一种简单的,固定的单帧方法,以定量表征携带ST-OAM的Ultrashort Light脉冲。使用我们的方法,可以从直接在原始数据上直接看到的唯一且明确的特征来轻松识别ST-OAM脉冲,包括其主要特征,例如拓扑电荷数和OAM螺旋,而无需对数据进行完整分析。处理和重建后,也可以完全表征其他精致的特征,包括脉冲分散和束发散。我们的快速表征方法允许在ST-OAM脉冲的生成和光学对齐过程中进行高通量和快速反馈。通过使用与脉冲重复速率相匹配的高速摄像头,将我们的方法扩展到单发测量很直接。这种新方法可以帮助推进空间和时间结构的光及其在高级计量学中的应用。
Light carrying spatiotemporal orbital angular momentum (ST-OAM) makes possible new types of optical vortices arising from transverse OAM. ST-OAM pulses exhibit novel properties during propagation, transmission, refraction, diffraction, and nonlinear conversion, attracting growing experimental and theoretical interest and studies. However, one major challenge is the lack of a simple and straightforward method for characterizing ultrafast ST-OAM pulses. Using spatially resolved spectral interferometry, we demonstrate a simple, stationary, single-frame method to quantitatively characterize ultrashort light pulses carrying ST-OAM. Using our method, the presence of an ST-OAM pulse, including its main characteristics such as topological charge numbers and OAM helicity, can be identified easily from the unique and unambiguous features directly seen on the raw data--without any need for a full analysis of the data. After processing and reconstructions, other exquisite features, including pulse dispersion and beam divergence, can also be fully characterized. Our fast characterization method allows high-throughput and quick feedback during the generation and optical alignment processes of ST-OAM pulses. It is straightforward to extend our method to single-shot measurement by using a high-speed camera that matches the pulse repetition rate. This new method can help advance the field of spatially and temporally structured light and its applications in advanced metrologies.