论文标题

现场发射器静电学:特别强调现代高精度有限元建模的评论

Field emitter electrostatics: a review with special emphasis on modern high-precision finite-element modelling

论文作者

de Assis, Thiago A., Dall'Agnol, Fernando F., Forbes, Richard G.

论文摘要

该综述的综述涵盖了分析性,数值和拟合形式的方法,这是同类产品中的第一个综述。审查主要与发射器以电子理想方式运行的情况有关,并且适用零电流的静电。术语是仔细描述的,并且是独立的。因此,该综述适用于场电子和场离子发射器。它也更普遍地适用于表现出“静电灯效应”的带电的,尖的电子调节器,但在通用电力和磁道主义文献中进行了很差的讨论。现代电子电导器静电是电子热力学和电子统计力学的应用。该评论主要关注两种常见的基本发射极形式的静电:传统投影技术中使用的针状发射器;以及通常用于对大区域多发射极电子源进行建模的发射器。在平面后环境中,我们详细考虑了单个柱子的静电以及由于静电去极化而发生的两个相同帖子之间的相互作用(通常称为“筛选”或“屏蔽”)。综述的核心是对实现有效的有限元素方法静电模拟的“最小域维度”方法的讨论,以及导致无量纲场增强因子的非常精确估计的变体(在存在分析比较的情况下,在情况下,错误通常小于0.001%的误差小于0.001%)。简短的轮廓讨论和核心参考是针对许多与静电情况,方法和结果相关的“相关考虑因素”中的每一个。建议在进一步的研究和/或单独的迷你审查可能有用的地方发射器静电学领域。

This review of quantitative field emitter electrostatics, covering analytical, numerical and fitted-formula approaches, is thought the first of its kind. The review relates chiefly to situations where emitters operate in an electronically ideal manner, and zero-current electrostatics is applicable. Terminology is carefully described and is polarity independent; thus the review applies to both field electron and field ion emitters. It also applies more generally to charged, pointed electron-conductors that exhibit the "electrostatic lightning-rod effect", but are poorly discussed in general electricity and magnetism literature. Modern electron-conductor electrostatics is an application of the chemical thermodynamics and statistical mechanics of electrons. The review focuses chiefly on the electrostatics of two common basic emitter forms: the needle-shaped emitters used in traditional projection technologies; and the post-shaped emitters often used in modelling large-area multi-emitter electron sources. In the post-on-plane context, we consider in detail both the electrostatics of the single post and the interaction between two identical posts that occurs as a result of electrostatic depolarization (often called "screening" or "shielding"). Core to the review are discussions of the "minimum domain dimensions" method for implementing effective finite-element-method electrostatic simulations, and of the variant that leads to very precise estimates of dimensionless field enhancement factors (error typically less than 0.001 % in situations where analytical comparisons exist). Brief outline discussions, and core references, are given for each of many "related considerations" that are relevant to the electrostatic situations, methods and results described. Many areas of field emitter electrostatics are suggested where further research and/or separate mini-reviews would probably be useful.

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