论文标题
充电对单个面膜三重宝石检测器均匀性的影响
Effect of charging-up on the uniformity of a single mask triple GEM detector
论文作者
论文摘要
气体电子乘数（GEM）检测器是微型模式气体检测器（MPGD）家族的高级成员之一，该家族用于高能物理（HEP）实验，作为跟踪设备，由于其高速率处理能力和良好的空间分辨率。检测器性能的均匀性是任何跟踪设备的基本标准。 在暴露于外部照射时，在宝石腔的活跃体积内的介电介质（Kapton）的存在会改变其行为。这种现象被称为充电效应。在本文中，据报道，据报道，充电和未充电的宝石箔均报道了单个面罩（SM）三颗粒尺寸10厘米$ 10厘米的三重宝石腔室的均匀性。
The Gas Electron Multiplier (GEM) detector is one of the advanced members of the Micro Pattern Gas Detector (MPGD) family, used in High Energy Physics (HEP) experiments as a tracking device due to its high rate handling capability and good spatial resolution. The uniformity in the performance of the detector is an essential criterion for any tracking device. The presence of the dielectric medium (Kapton) inside the active volume of the GEM chamber changes its behaviour when exposed to external irradiation. This phenomenon is known as the charging-up effect. In this article, the uniformity in terms of gain, energy resolution and count rate of a Single Mask (SM) triple GEM chamber of dimension 10 cm $\times$ 10 cm are reported for both the charged-up and uncharged GEM foils.
