论文标题
死物质的进一步实验证据在电容设备中具有记忆猜想
Further Experimental Evidence of the Dead Matter Has Memory Conjecture in Capacitive Devices
论文作者
论文摘要
这项研究提供了一组新的实验结果,支持Westerlund的猜想,即死物质具有记忆。在最近的一些研究中,已经在一项实验中观察到并报道了整合其先前刺激和状态史的电动电容器(EDLC)动态响应中的记忆效应。在这些研究中,用于量化此类效果的不同激发信号旨在将设备充电相同的电压值和完全相同的累积电荷水平,但以不同的方式为累积的电荷水平。达到了相同的独特电压电荷点后,观察到发生了不同但可重复的放电模式,证明了记忆的存在。这项工作的目的是提供进一步的实验证据,以响应具有不同统计特性的时变固定输入激励,以响应EDLC中固有的记忆效应。特别是,创建了由固定的DC值组成的不同集电压波形,这些电压波形由固定的DC值组成,它们具有叠加的不同振幅的均匀分布的随机波动,并用于将相同的EDLC设备充电到独特的电压电荷点。这些信号的持续时间是相同的,但围绕平均值的差异值不同。我们观察到不同的时间充电响应,具体取决于这些充电波形中噪声水平的程度。使用非理想电容器的分数电压电压方程在固有内存的背景下进行解释和讨论。
This study provides new sets of experimental results supporting Westerlund's conjecture that Dead Matter Has Memory. Memory effects in the dynamic response of electric double-layer capacitors (EDLCs) that integrate its prior history of stimulation and state have been experimentally observed and reported in a few recent studies. The different excitation signals used to quantify such effects in these studies aimed at charging a device to the same voltage value and the exact same accumulated charge level but in different manners. Having reached the same unique voltage-charge point, it was observed that different yet repeatable discharge patterns occur, proving the existence of memory. The aim of this work is to provide further experimental evidence of the inherent memory effect in EDLCs in response to time-varying stationary input excitations with different statistical properties. In particular, different sets of charging voltage waveforms composed of fixed dc values with superimposed uniformly-distributed random fluctuations of different amplitudes were created and used to charge the same EDLC device to a unique voltage-charge point. The duration of these signals was the same but with different values of variance around the mean value. We observed different time-charge responses depending on the extent of the noise level in these charging waveforms. This is interpreted and discussed in the context of inherent memory using fractional-order voltage-charge equations of non-ideal capacitors.