论文标题
通过电子温度在低阶有理表面平坦的微电湍流饱和度
Microtearing turbulence saturation via electron temperature flattening at low-order rational surfaces
论文作者
论文摘要
微型不稳定性是高$β$ tokamaks中湍流运输的主要来源之一。这些模式在低阶有理磁场线上导致非常局部的传输，我们表明，在这些有理表面下局部电子温度梯度的变平在设置微电湍流中饱和通量水平方面起着重要作用。这个过程至关重要的是有理表面的密度，因此要取决于系统大小，并导致典型的现有tokamaks和仿真的系统尺寸的较差的系统尺寸。
Microtearing instability is one of the major sources of turbulent transport in high-$β$ tokamaks. These modes lead to very localized transport at low-order rational magnetic field lines, and we show that flattening of the local electron temperature gradient at these rational surfaces plays an important role in setting the saturated flux level in microtearing turbulence. This process depends crucially on the density of rational surfaces, and thus the system-size, and gives rise to a worse-than-gyro-Bohm transport scaling for system-sizes typical of existing tokamaks and simulations.
