论文标题

压力引起的声子爆发和准粒子中毒的来源

A Stress Induced Source of Phonon Bursts and Quasiparticle Poisoning

论文作者

Anthony-Petersen, Robin, Biekert, Andreas, Bunker, Raymond, Chang, Clarence L., Chang, Yen-Yung, Chaplinsky, Luke, Fascione, Eleanor, Fink, Caleb W., Garcia-Sciveres, Maurice, Germond, Richard, Guo, Wei, Hertel, Scott A., Hong, Ziqing, Kurinsky, Noah, Li, Xinran, Lin, Junsong, Lisovenko, Marharyta, Mahapatra, Rupak, Mayer, Adam, McKinsey, Daniel N., Mehrotra, Siddhant, Mirabolfathi, Nader, Neblosky, Brian, Page, William A., Patel, Pratyush K., Penning, Bjoern, Pinckney, H. Douglas, Platt, Mark, Pyle, Matt, Reed, Maggie, Romani, Roger K., Queiroz, Hadley Santana, Sadoulet, Bernard, Serfass, Bruno, Smith, Ryan, Sorensen, Peter F., Suerfu, Burkhant, Suzuki, Aritoki, Underwood, Ryan, Velan, Vetri, Wang, Gensheng, Wang, Yue, Watkins, Samuel L., Williams, Michael R., Yefremenko, Volodymyr, Zhang, Jianjie

论文摘要

超导量子的性能通过一组特征不佳的能量来源降低,破坏了负责超导性的库珀配对,造成了一种经常被称为``准粒子中毒''的疾病。两个超导速度和低阈值的脱粒量均过多的时间,这些速度均超过了静止的速率,这些速度均为静止的速率,以至于静止不动,以至于均降低了速率。它的持有人表现出比在低压力状态下从其持有人悬挂的功能相同的晶体中,其低数量的速率大于两个数量级。我们认为,胶水和晶体之间热诱导的应力的松弛是这些事件的来源。

The performance of superconducting qubits is degraded by a poorly characterized set of energy sources breaking the Cooper pairs responsible for superconductivity, creating a condition often called ``quasiparticle poisoning". Both superconducting qubits and low threshold dark matter calorimeters have observed excess bursts of quasiparticles or phonons that decrease in rate with time. Here, we show that a silicon crystal glued to its holder exhibits a rate of low-energy phonon events that is more than two orders of magnitude larger than in a functionally identical crystal suspended from its holder in a low-stress state. The excess phonon event rate in the glued crystal decreases with time since cooldown, consistent with a source of phonon bursts which contributes to quasiparticle poisoning in quantum circuits and the low-energy events observed in cryogenic calorimeters. We argue that relaxation of thermally induced stress between the glue and crystal is the source of these events.

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