论文标题
控制AZ31毫克合金中疲劳裂纹启动机制的微观结构因素的定量评估
Quantitative assessment of the microstructural factors controlling the fatigue crack initiation mechanisms in AZ31 Mg alloy
论文作者
论文摘要
通过滑动痕量分析和二级电子显微镜在质感的AZ31B-O MG合金中研究了变形和疲劳裂纹成核机制,该机制在两种不同的环状菌株半层状上受到完全反转的环状变形。由于不同变形机制的激活,将样品在两个方向上变形,从而导致对称和非对称循环应力应变曲线。在样品的纵向部分中确定了它们,其中包括大量谷物(每个样品的1500到4500),以获得统计学上的显着结果。如果主要的变形机制是基础滑动和拉伸双孪晶/脱字,则将最具破坏性的疲劳裂纹沿着大谷物中的双胞胎成核,以及平行于与基础滑移带的裂纹,与基础滑移带的定位与适当定向的小谷物方面的变形物的定位相关。如果主要变形机制是拉伸二链/detwinning和锥体滑动,则将最长的疲劳裂纹沿大晶粒中的金字塔式滑移带对成核。在所有情况下都发现了周围小晶粒周围的晶界裂纹,但是从疲劳失败的角度来看,它们并不是至关重要的。该信息与评估微结构特征对MG合金疲劳寿命的影响有关,并输入使用疲劳指示剂参数模拟MG合金的疲劳行为。
The deformation and fatigue crack nucleation mechanisms were studied by means of slip trace analysis and secondary electron microscopy in a textured AZ31B-O Mg alloy subjected to fully-reversed cyclic deformation at two different cyclic strain semi-amplitudes. Samples were deformed in two orientations leading to symmetric and non-symmetric cyclic stress-strain curves due to the activation of different deformation mechanisms. They were ascertained in longitudinal sections of the specimens, which included a large number of grains (from 1500 to 4500 for each specimen), to obtain statistically significant results. If the dominant deformation mechanisms were basal slip and tensile twinning/detwinning, the most damaging fatigue cracks were nucleated along twins in large grains, together with cracks parallel to basal slip bands associated with the localization of deformation in clusters of small grains suitably oriented for basal slip. If the main deformation mechanisms were tensile twinning/detwinning and pyramidal slip, the longest fatigue cracks were nucleated along pyramidal slip bands in large grains. Grain boundary cracks around small grains were found in all cases, but they were not critical from the viewpoint of fatigue failure. This information is relevant to assess the effect of the microstructural features on the fatigue life of Mg alloys and as input to simulate the fatigue behavior of Mg alloys using fatigue indicator parameters.