论文标题
指导性卷积用于相关光和电子显微镜
Guided-deconvolution for Correlative Light and Electron Microscopy
论文作者
论文摘要
相关光和电子显微镜是研究细胞内部结构的强大工具。它结合了相关光（LM）和电子（EM）显微镜信息的相互益处。但是，将LM叠加到EM图像以将功能分配给结构信息的经典方法受到LM图像中可见的结构细节的巨大差异的阻碍。本文旨在研究一种优化的方法，我们称之为EM引导的反卷积。它试图将荧光标记的结构自动分配给EM图像中可见的细节，以弥合两种成像模式之间的分辨率和特异性的间隙。
Correlative light and electron microscopy is a powerful tool to study the internal structure of cells. It combines the mutual benefit of correlating light (LM) and electron (EM) microscopy information. However, the classical approach of overlaying LM onto EM images to assign functional to structural information is hampered by the large discrepancy in structural detail visible in the LM images. This paper aims at investigating an optimized approach which we call EM-guided deconvolution. It attempts to automatically assign fluorescence-labelled structures to details visible in the EM image to bridge the gaps in both resolution and specificity between the two imaging modes.
