论文标题
厚度控制的perovskite srruo $ _3 $薄膜的电子带重建的演变
Evolution of electronic band reconstruction in thickness-controlled perovskite SrRuO$_3$ thin films
论文作者
论文摘要
过渡金属钙钛矿氧化物显示出各种新兴现象，这些现象可通过调整氧气八人体旋转来调整。 Srruo $ _3 $，一种铁磁性钙钛矿氧化物，众所周知，当生长为薄膜时，具有各种原子结构和八面体旋转。但是，几乎没有研究电子结构如何随膜厚度而变化。在这里，通过使用角度分辨光发射光谱和电子衍射技术，我们研究了srruo $ _3 $薄膜的电子结构作为膜厚度的函数。对于具有不同厚度的膜，观察到不同的重建电子结构和光谱重量。我们建议，可以通过比较不同带的强度来定性地估算表面上的八面体旋转。我们的观察和方法阐明了如何通过光发射光谱数据来理解结构变化和过渡。
Transition metal perovskite oxides display a variety of emergent phenomena which are tunable by tailoring the oxygen octahedral rotation. SrRuO$_3$, a ferromagnetic perovskite oxide, is well-known to have various atomic structures and octahedral rotations when grown as thin films. However, how the electronic structure changes with the film thickness has been hardly studied. Here, by using angle-resolved photoemission spectroscopy and electron diffraction techniques, we study the electronic structure of SrRuO$_3$ thin films as a function of the film thickness. Different reconstructed electronic structures and spectral weights are observed for films with various thicknesses. We suggest that octahedral rotations on the surface can be qualitatively estimated via comparison of intensities of different bands. Our observation and methodology shed light on how structural variation and transition may be understood in terms of photoemission spectroscopy data.
