论文标题
使用无错误的虚拟Z-GATE模型对Qudit逻辑门进行有效表征
Efficient characterization of qudit logical gates with gate set tomography using an error-free Virtual-Z-gate model
论文作者
论文摘要
栅极层析成像（GST）表征了量子逻辑门的过程矩阵，以及量子处理器中的测量和状态准备误差。 GST通常需要广泛的数据收集和大量的计算资源来进行模型估计。我们提出了一种更有效的GST方法，用于使用Qudit Hadamard和Virtual Z Gates来构建信托，同时假设虚拟Z门无错误。我们的方法降低了估计表征结果的计算成本，从而使GST更加实用。我们在实验上证明了这种方法在超导式transmon Qutrit上的适用性。
Gate-set tomography (GST) characterizes the process matrix of quantum logic gates, along with measurement and state preparation errors in quantum processors. GST typically requires extensive data collection and significant computational resources for model estimation. We propose a more efficient GST approach for qudits, utilizing the qudit Hadamard and virtual Z gates to construct fiducials while assuming virtual Z gates are error-free. Our method reduces the computational costs of estimating characterization results, making GST more practical at scale. We experimentally demonstrate the applicability of this approach on a superconducting transmon qutrit.
