论文标题
磁性传输X射线显微镜测量的元素特异性一阶反向曲线
Element-Specific First Order Reversal Curves Measured by Magnetic Transmission X-ray Microscopy
论文作者
论文摘要
一阶反转曲线（FORC）方法是一种宏观测量技术，可用于提取滞后系统的定量微观特性。使用磁性传输X射线显微镜（MTXM），在20 nm厚的COTB膜上进行局部元素特异性福克斯测量。用显微镜测量的福克斯在磁场循环方案下揭示了分步域的演变，并直接可视化了福克图的机械解释。将它们与磁力测定法进行了比较，并显示出良好的定量一致性。此外，MTXM的高空间分辨率和特定于元素的灵敏度为测量小区域或多组分系统中特定阶段的FORC（包括异质结构中的埋入层）提供了新的功能。通过MTXM-FORC测量具有涡旋状Landau结构的MTXM-FORC测量，可以在很小的特征上执行FORC。这项工作证明了两种独特功能的技术的汇合，以实现对纳米级磁性行为的定量见解。
The first order reversal curve (FORC) method is a macroscopic measurement technique which can be used to extract quantitative, microscopic properties of hysteretic systems. Using magnetic transmission X-ray microscopy (MTXM), local element-specific FORC measurements are performed on a 20 nm thick film of CoTb. The FORCs measured with microscopy reveal a step-by-step domain evolution under the magnetic field cycling protocol, and provide a direct visualization of the mechanistic interpretation of FORC diagrams. They are compared with magnetometry FORCs and show good quantitative agreement. Furthermore, the high spatial resolution and element-specific sensitivity of MTXM provide new capabilities to measure FORCs on small regions or specific phases within multicomponent systems, including buried layers in heterostructures. The ability to perform FORCs on very small features is demonstrated with the MTXM-FORC measurement of a rectangular microstructure with vortex-like Landau structures. This work demonstrates the confluence of two uniquely powerful techniques to achieve quantitative insight into nanoscale magnetic behavior.
