论文标题
通用的冷冻-CMOS设备建模和可靠的低温IC设计的EDACAPATAICAIBLE平台
Generic Cryo-CMOS Device Modeling and EDACompatible Platform for Reliable Cryogenic IC Design
论文作者
论文摘要
本文概述了建立通用的低温CMOS数据库，其中关键电参数和MOSFET的传输特性被量化为设备尺寸，温度/频率响应的功能。同时，进行了全面的装置统计研究，以评估低温下变异和不匹配效应的影响。此外，通过将冷冻-CMOS紧凑型模型纳入工艺设计套件（PDK），设计了低温4 kb SRAM，5位Flash ADC和8位当前转向DAC，并且可以轻松地调查并在EDA兼容的平台上进行了优化，并在EDA兼容的平台上进行了优化，从而为大型尺寸cryogenic IC设计奠定了坚实的基础。
This paper outlines the establishment of a generic cryogenic CMOS database in which key electrical parameters and transfer characteristics of the MOSFETs are quantified as functions of device size, temperature/frequency responses. Meanwhile, comprehensive device statistical study is conducted to evaluate the influence of variation and mismatch effects at low temperatures. Furthermore, by incorporating the Cryo-CMOS compact model into the process design kit (PDK), the cryogenic 4 Kb SRAM, 5-bit flash ADC and 8-bit current steering DAC are designed, and their performance is readily investigated and optimized on the EDA-compatible platform, hence laying a solid foundation for large-scale cryogenic IC design.
