论文标题
基于图形的相互作用表征量子基准，用于改进量子电路映射技术
Interaction graph-based characterization of quantum benchmarks for improving quantum circuit mapping techniques
论文作者
论文摘要
要在量子处理器上执行量子电路，必须对其进行修改以满足量子设备的物理约束。这个称为量子电路映射的过程导致栅极/电路深度在头顶上取决于电路属性和硬件限制，这是有限的量子连接性的关键限制。在本文中，我们建议除了先前使用的电路描述参数外，还使用基于图理论的指标来扩展量子电路的表征。这种方法允许对量子电路进行深入分析和聚类，并在不同的量子处理器上进行性能进行比较，从而有助于开发更好的映射技术。我们的研究揭示了基于图形的参数与量子设备各种现有配置的映射性能指标之间的相关性。我们还提供了量子电路和算法的全面集合，用于基准未来的编译技术和量子设备。
To execute quantum circuits on a quantum processor, they must be modified to meet the physical constraints of the quantum device. This process, called quantum circuit mapping, results in a gate/circuit depth overhead that depends on both the circuit properties and the hardware constraints, being the limited qubit connectivity a crucial restriction. In this paper, we propose to extend the characterization of quantum circuits by including qubit interaction graph properties using graph theory-based metrics in addition to previously used circuit-describing parameters. This approach allows for in-depth analysis and clustering of quantum circuits and a comparison of performance when run on different quantum processors, aiding in developing better mapping techniques. Our study reveals a correlation between interaction graph-based parameters and mapping performance metrics for various existing configurations of quantum devices. We also provide a comprehensive collection of quantum circuits and algorithms for benchmarking future compilation techniques and quantum devices.
